Prof. Mark Goorsky
Ion implantation presents a continuously evolving technology. While the benefits of ion implantation are well recognized for many commercial endeavors, there have been recent developments in this field. Improvements in equipment, understanding of beam-solid interactions, applications to new materials, improved characterization techniques, and more recent developments to use implantation for nanostructure formation point to new directions for ion implantation and are presented in this book.
Enhanced Fourier Transforms for X-Ray Scattering Applications
in the book "Fourier Transforms - Approach to Scientific Principles" edited by Goran Nikolic, ISBN 978-953-307-231-9, InTech, April 4, 2011
Lattice Strain Measurements in Hydrogen Implanted Materials for Layer Transfer Processes
in the book "Ion Implantation" edited by Mark Goorsky, ISBN 978-953-51-0634-0, InTech, May 5, 2012