Dr. Khan Maaz


Working as Principal Scientist (Associate Professor) at PINSTECH, Islamabad, Pakistan. Research interests include: synthesis, structural, optical, and magnetic properties of nano-materials (nanoparticles and nanowires).


  • 2012 - current


  • 2015 - 2016

    Chinese Academy of Science


  • 1988 – 1990

    Turlandi, Swabi

  • 1997 - 1999

    Science, PIEAS, Islamabad


  • 2004 – 2008

    Natural Science, Quaid-i-Azam University, ISLAMABAD


Edited Books

  • The Transmission Electron Microscope - Theory and Applications

    This book The Transmission Electron Microscope abundantly illustrates necessary insight and guidance of this powerful and versatile material characterization technique with complete figures and thorough explanations. The second edition of the book presents deep understanding of new techniques from introduction to advance levels, covering in-situ transmission electron microscopy, electron and focused ion beam microscopy, and biological diagnostic through TEM. The chapters cover all major aspects of transmission electron microscopy and their uses in material characterization with special emphasis on both the theoretical and experimental aspects of modern electron microscopy techniques. It is believed that this book will provide a solid foundation of electron microscopy to the students, scientists, and engineers working in the field of material science and condensed matter physics.

  • The Transmission Electron Microscope

    The book "The Transmission Electron Microscope" contains a collection of research articles submitted by engineers and scientists to present an overview of different aspects of TEM from the basic mechanisms and diagnosis to the latest advancements in the field. The book presents descriptions of electron microscopy, models for improved sample sizing and handling, new methods of image projection, and experimental methodologies for nanomaterials studies. The selection of chapters focuses on transmission electron microscopy used in material characterization, with special emphasis on both the theoretical and experimental aspect of modern electron microscopy techniques. I believe that a broad range of readers, such as students, scientists and engineers will benefit from this book.