Dr. Martin Veis
Charles University Prague, Czech Republic
Publications
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Book Chapter
Atomic Force Microscopy in Optical Imaging and Characterization
in the book "Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale" edited by Victor Bellitto, ISBN 978-953-51-0414-8, InTech, March 3, 2012 -
Book Chapter
Fourier Factorization in the Plane Wave Expansion Method in Modeling Photonic Crystals
in the book "Photonic Crystals - Introduction, Applications and Theory" edited by Alessandro Massaro, ISBN 978-953-51-0431-5, InTech, March 3, 2012