Nanowires - Implementations and Applications, ISBN: 978-953-307-318-7
Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy
By Elad Koren, Jonathan E. Allen, Uri Givan, Noel Berkovitch, Eric R. Hemesath, Lincoln J. Lauhon and Yossi Rosenwaks
DOI: 10.5772/19333