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Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy

Written By

Elad Koren, Jonathan E. Allen, Uri Givan, Noel Berkovitch, Eric R. Hemesath, Lincoln J. Lauhon and Yossi Rosenwaks

Submitted: 03 November 2010 Published: 18 July 2011

DOI: 10.5772/19333

From the Edited Volume

Nanowires - Implementations and Applications

Edited by Abbass Hashim

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Written By

Elad Koren, Jonathan E. Allen, Uri Givan, Noel Berkovitch, Eric R. Hemesath, Lincoln J. Lauhon and Yossi Rosenwaks

Submitted: 03 November 2010 Published: 18 July 2011