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This book is indexed in
Engineering » Electrical and Electronic Engineering
Micro Electronic and Mechanical Systems
Edited by Kenichi Takahata, ISBN 978-953-307-027-8, Hard cover, 386 pages, Publisher: InTech, Chapters published December 01, 2009 under CC BY-NC-SA 3.0 license
DOI: 10.5772/46118
This book discusses key aspects of MEMS technology areas, organized in twenty-seven chapters that present the latest research developments in micro electronic and mechanical systems. The book addresses a wide range of fundamental and practical issues related to MEMS, advanced metal-oxide-semiconductor (MOS) and complementary MOS (CMOS) devices, SoC technology, integrated circuit testing and verification, and other important topics in the field. Several chapters cover state-of-the-art microfabrication techniques and materials as enabling technologies for the microsystems. Reliability issues concerning both electronic and mechanical aspects of these devices and systems are also addressed in various chapters.
- Chapter 1
Membrane Micro Emboss (MeME) Process for 3-D Membrane Microdevice - Chapter 2
A Review of Thermoelectric MEMS Devices for Micro-power Generation, Heating and Cooling Applications - Chapter 3
Micro Power Generation from Micro Fuel Cell Combined with Micro Methanol Reformer - Chapter 4
Non-Contact Measurement of Thickness Uniformity of Chemically Etched Si Membranes by Fiber-Optic Low-Coherence Interferometry - Chapter 5
Nanomembrane: A New MEMS/NEMS Building Block - Chapter 6
Nanomembrane-Enabled MEMS Sensors: Case of Plasmonic Devices for Chemical and Biological Sensing - Chapter 7
Specific Serum-free Conditions can Differentiate Mouse Embryonic Stem Cells into Osteochondrogenic and Myogenic Progenitors. - Chapter 8
Micromanipulation with Haptic Interface - Chapter 9
Fabrication of High Aspect Ratio Microcoils for Electromagnetic Actuators - Chapter 10
Micro-Electro-Discharge Machining Technologies for MEMS - Chapter 11
Mechanical Properties of MEMS Materials - Chapter 12
Reliability of MEMS - Chapter 13
Numerical Simulation of Plasma-Chemical Processing Semiconductors - Chapter 14
Experimental Studies on Doped and Co-Doped ZnO Thin Films Prepared by RF Diode Sputtering - Chapter 15
Self-Aligned π-Shaped Source/Drain Ultrathin SOI MOSFETs - Chapter 16
Accurate LDMOS Model Extraction Using DC, CV and Small Signal S Parameters Measurements for Reliability Issues - Chapter 17
Comparative Analysis of High Frequency Characteristics of DDR and DAR IMPATT Diodes - Chapter 18
Ohmic Contacts for High Power and High Temperature Microelectronics - Chapter 19
Implications of Negative Bias Temperature Instability in Power MOS Transistors - Chapter 20
Radiation Hardness of Semiconductor Programmable Memories and Over-Voltage Protection Components - Chapter 21
ANN Application to Modelling of the D/A and A/D Interface for Mixed-mode Behavioural Simulation - Chapter 22
Electronic Circuits Diagnosis Using Artificial Neural Networks - Chapter 23
Integration Verification in System on Chips Using Formal Techniques - Chapter 24
Test Generation Based on CLP - Chapter 25
New Concepts of Asynchronous Circuits Worst-Case Delay and Yield Estimation - Chapter 26
Neuron Network Applied to Video Encoder - Chapter 27
Single Photon Eigen-Problem with Complex Internal Dynamics
