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Micro Electronic and Mechanical Systems
Edited by Kenichi Takahata, ISBN 978-953-307-027-8, Hard cover, 386 pages, Publisher: InTech, Published: December 01, 2009 under CC BY-NC-SA 3.0 license, in subject Electrical and Electronic Engineering
DOI: 10.5772/46118
This book discusses key aspects of MEMS technology areas, organized in twenty-seven chapters that present the latest research developments in micro electronic and mechanical systems. The book addresses a wide range of fundamental and practical issues related to MEMS, advanced metal-oxide-semiconductor (MOS) and complementary MOS (CMOS) devices, SoC technology, integrated circuit testing and verification, and other important topics in the field. Several chapters cover state-of-the-art microfabrication techniques and materials as enabling technologies for the microsystems. Reliability issues concerning both electronic and mechanical aspects of these devices and systems are also addressed in various chapters.
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Book contents
- Chapter 1Membrane Micro Emboss (MeME) Process for 3-D Membrane Microdevice
- Chapter 2A Review of Thermoelectric MEMS Devices for Micro-power Generation, Heating and Cooling Applications
- Chapter 3Micro Power Generation from Micro Fuel Cell Combined with Micro Methanol Reformer
- Chapter 4Non-Contact Measurement of Thickness Uniformity of Chemically Etched Si Membranes by Fiber-Optic Low-Coherence Interferometry
- Chapter 5Nanomembrane: A New MEMS/NEMS Building Block
- Chapter 6Nanomembrane-Enabled MEMS Sensors: Case of Plasmonic Devices for Chemical and Biological Sensing
- Chapter 7Specific Serum-free Conditions can Differentiate Mouse Embryonic Stem Cells into Osteochondrogenic and Myogenic Progenitors.
- Chapter 8Micromanipulation with Haptic Interface
- Chapter 9Fabrication of High Aspect Ratio Microcoils for Electromagnetic Actuators
- Chapter 10Micro-Electro-Discharge Machining Technologies for MEMS
- Chapter 11Mechanical Properties of MEMS Materials
- Chapter 12Reliability of MEMS
- Chapter 13Numerical Simulation of Plasma-Chemical Processing Semiconductors
- Chapter 14Experimental Studies on Doped and Co-Doped ZnO Thin Films Prepared by RF Diode Sputtering
- Chapter 15Self-Aligned π-Shaped Source/Drain Ultrathin SOI MOSFETs
- Chapter 16Accurate LDMOS Model Extraction Using DC, CV and Small Signal S Parameters Measurements for Reliability Issues
- Chapter 17Comparative Analysis of High Frequency Characteristics of DDR and DAR IMPATT Diodes
- Chapter 18Ohmic Contacts for High Power and High Temperature Microelectronics
- Chapter 19Implications of Negative Bias Temperature Instability in Power MOS Transistors
- Chapter 20Radiation Hardness of Semiconductor Programmable Memories and Over-Voltage Protection Components
- Chapter 21ANN Application to Modelling of the D/A and A/D Interface for Mixed-mode Behavioural Simulation
- Chapter 22Electronic Circuits Diagnosis Using Artificial Neural Networks
- Chapter 23Integration Verification in System on Chips Using Formal Techniques
- Chapter 24Test Generation Based on CLP
- Chapter 25New Concepts of Asynchronous Circuits Worst-Case Delay and Yield Estimation
- Chapter 26Neuron Network Applied to Video Encoder
- Chapter 27Single Photon Eigen-Problem with Complex Internal Dynamics
