Open access peer-reviewed Edited Volume

Scanning Probe Microscopy - Physical Property Characterization at Nanoscale

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Academic Editor

Vijay Nalladega
Vijay Nalladega

University of Dayton,
United States of America

Published27 April 2012

Doi10.5772/2653

ISBN978-953-51-0576-3

eBook (PDF) ISBN978-953-51-4998-9

Copyright year2012

Number of pages256

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  • Dimension
  • OpenAIRE
  • AZ ebsco
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Table of Contents

Open access  chapters

1. Multiple Material Property Characterization Using Induced Currents and Atomic Force Microscopy

By Vijay Nalladega, Shamachary Sathish, Kumar V. Jata and Mark P. Blodgett

2,026
3. Statistical Analysis in Homopolymeric Surfaces

By Eralci M. Therézio, Maria L. Vega, Roberto M. Faria and Alexandre Marletta

2,521
1
4. Polyamide-Imide Membranes of Various Morphology - Features of Nano-Scale Elements of Structure

By S.V. Kononova, G.N. Gubanova, K.A. Romashkova, E.N. Korytkova and D. Timpu

4,079
2
5. Characterization of Complex Spintronic and Superconducting Structures by Atomic Force Microscopy Techniques

By L. Ciontea, M.S. Gabor, T. Petrisor Jr., T. Ristoiu, C. Tiusan and T. Petrisor

2,096
2,463

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28,922 Total Chapter Downloads

1,012 Total Chapter Views

10 Crossref Citations

14 Web of Science Citations

23 Dimensions Citations

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