Open access peer-reviewed Edited Volume

Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale

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Academic Editor

Victor Bellitto
Victor Bellitto

Naval Surface Warfare Center,
United States of America

Published23 March 2012

Doi10.5772/2673

ISBN978-953-51-0414-8

eBook (PDF) ISBN978-953-51-4987-3

Copyright year2012

Number of pages270

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Table of Contents

Open access  chapters

3. Magnetic Force Microscopy: Basic Principles and Applications

By F.A. Ferri, M.A. Pereira-da-Silva and E. Marega Jr.

7,571
5
5. Wavelet Transforms in Dynamic Atomic Force Spectroscopy

By Giovanna Malegori and Gabriele Ferrini

2,506
2
7. Measurement of the Nanoscale Roughness by Atomic Force Microscopy: Basic Principles and Applications

By R.R.L. De Oliveira, D.A.C. Albuquerque, T.G.S. Cruz, F.M. Yamaji and F.L. Leite

21,965
28
8. Predicting Macroscale Effects Through Nanoscale Features

By Victor J. Bellitto and Mikhail I. Melnik

2,292
9. AFM Application in III-Nitride Materials and Devices

By Z. Chen, L.W. Su, J.Y. Shi, X.L. Wang, C.L. Tang and P. Gao

4,051
1
10. Atomic Force Microscopy to Characterize the Healing Potential of Asphaltic Materials

By Prabir Kumar Das, Denis Jelagin, Björn Birgisson and Niki Kringos

2,904
3

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60,985 Total Chapter Downloads

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63 Crossref Citations

127 Web of Science Citations

187 Dimensions Citations

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