Chemistry » Electrochemistry » "Scanning Probe Microscopy-Physical Property Characterization at Nanoscale", book edited by Vijay Nalladega, ISBN 978-953-51-0576-3, Published: April 27, 2012 under CC BY 3.0 license
Chapter 1
Multiple Material Property Characterization Using Induced Currents and Atomic Force Microscopy
By Vijay Nalladega, Shamachary Sathish, Kumar V. Jata and Mark P. Blodgett
DOI: 10.5772/35594
- Dr. Vijay Nalladega
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Update my profile » - Vijayaraghava Nalladega is a Research Engineer in the Structural Integrity Division of University of Dayton Research Institute. He has PhD and MS degrees in Mechanical Engineering from University of Dayton, respectively. The primary focus of his research work is materials characterization using atomic force microscopy and scanning probe microscopy techniques. His research also involves the design and development of novel scanning probe microscopy techniques for imaging multiple physical properties of materials at the nanoscale, as well as development of AFM based nanoscale nondestructive evaluation (NDE) techniques. Dr. Nalladega’s other research interests include ultrasonic NDE, nonlinear ultrasonics, and design of interdigital transducer sensors for structural health monitoring (SHM) applications.
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Publications
- Dr. Kumar Jata
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Update my profile » - United States of America , Wright Patterson Air Force Base
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Publications
- Dr. Shamachary Sathish
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Update my profile » - United States of America , University of Dayton Research Institute
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Publications
- Dr. Mark Blodgett
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Update my profile » - United States of America , Wright Patterson Air Force Base
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Publications