Chemistry » Electrochemistry

Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale

Edited by Victor Bellitto, ISBN 978-953-51-0414-8, 268 pages, Publisher: InTech, Chapters published March 23, 2012 under CC BY 3.0 license
DOI: 10.5772/2673
Edited Volume

With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.